FISIQ® X

The latest, most accurate and intelligent XRF software for coating thickness measurement and material analysis on the market.

¹ Measurement of Au/Pd/Ni/CuFe coating system. Comparison calculation time between WinFTM® 6 and FISIQ® X. ² Material analysis of a gold alloy layer with 9 different elements. Comparison calculation time between WinFTM® 6 and FISIQ® X.

Minimize user influence and simplify measurements to the maximum: this is what you achieve with FISIQ® X, the most intuitive and modern XRF software. With a menu adapted to the user, the software takes you by the hand and guides you through the workflow-based measurement process. The improved algorithm enables outstanding stability, accuracy and maximum repeatability - and thus significantly improves measurement times. FISIQ® X is currently available for the FISCHERSCOPE® XDAL® and FISCHERSCOPE® XDV® devices.

Central operating functions and information clearly in focus

For efficient measurement processes and easy handling

Excellent stability, accuracy, and highest repeatability, even for the most challenging measurement tasks

Analyze and compare your spectra more conveniently than ever before

Simple, guided calibration workflow and Fischer calibration standards with DAkkS certificate

Standard library for clear management of your calibration standards