FISCHERSCOPE® X-RAY XDAL® 600
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Universal instrument for measuring on smallest structures, very thin multilayer coatings, functional coatings and very thin coatings ≤ 0.1µm.
Key Benefits
- Versatile.: Ideal for electronics and semiconductor industry
- RoHS analysis.: Reliable determination of hazardous substances
- Quick-measure design.: The sample is placed and ready for measurement in just a few steps
- Balanced.: Optimal cost-benefit ratio
Description
Universal instrument for measuring on smallest structures, very thin multilayer coatings, functional coatings and very thin coatings ≤ 0.1 µm.
Availability depending on region and country.
¹ Significantly better standard deviation and thus measurement capability or significantly reduced measurement time in comparison DPP to DPP+.
The FISCHERSCOPE® X-RAY XDAL® 600 is the universal XRF analyzer from Fischer for the determination of thin layers, trace elements and alloys. With top down measurement, the sample is simply placed on the manually operated shear table. A laser pointer serves as a positioning aid. This means that even samples with complex geometries can be analyzed precisely and easily.
Ideal for electronics and semiconductor industry
Reliable determination of hazardous substances
The sample is placed and ready for measurement in just a few steps
Optimal cost-benefit ratio
Shorter measuring times or improvement of standard deviation*
*compared to the DPP
Silicon drift detector with extra-large effective area of 20 mm²
4-fold changeable apertures and 3-fold changeable filters
Higher count rates and significantly reduced measurement times thanks to DPP+
Microfocus tube with tungsten anode
Up to 140 mm possible height of samples
Measuring spot approx.: Ø 0.15 mm
Do you have further applications? Then contact us!
Features
- Silicon drift detector with extra-large effective area of 20 mm²
- 4-fold changeable apertures and 3-fold changeable filters
- Higher count rates and significantly reduced measurement times thanks to DPP+
- Microfocus tube with tungsten anode
- Up to 140 mm possible height of samples
- Measuring spot approx.: Ø 0.15 mm
- Up to 50% ¹ improved performance thanks to DPP+
- Manual adjustable sample table for fast and easy probe positioning
- Adjustment of the measuring distance through patented DCM method
- Analysis of thin and very thin coatings of ≤ 0.1 µm
- Measuring functional coatings in the electronics and semiconductor industry, such as on lead frames, plug contacts or PCBs
- Determination of complex multilayer systems
- Determination of lead content in solders
- Determination of phosphorus content in NiP coatings
