FISCHERSCOPE® X-RAY XAN®
The XRF system for a wide range of applications.
Universal instrument for metal and precious metal analysis as well as coating thickness measurement on simple shaped samples and RoHS screening.
Key Benefits
- Versatile.: For trade, industry and laboratory applications
- Quick-measure design.: The sample is placed and ready for measurement in just a few steps
- Commissioning.: Extremely fast and simple
- RoHS analysis.: Reliable determination of hazardous substances
Description
Universal instrument for metal and precious metal analysis as well as measuring coating thickness on simple shaped samples and RoHS screening.
Whether PIN detector, silicon drift detector, fixed sample support or manually operated XY-table: The FISCHERSCOPE® X-RAY XAN® offers versatile application support and is adaptable to your specific needs. This enables precise material analysis of precious metal and gold alloys, coating thickness measurement or trace analysis. The instrument version with the 50 mm² silicon drift detector is also suitable for RoHS measuring.
For trade, industry and laboratory applications
The sample is placed and ready for measurement in just a few steps
Extremely fast and simple
Reliable determination of hazardous substances
Even shorter measuring times with the same standard deviation**
*not with FISCHERSCOPE® X-RAY XAN® 215 **compared to the DPP
Microfocus tube with tungsten anode
Silicon PIN and silicon drift detectors provide very good detection accuracy and high resolution
Higher count rates and significantly reduced measurement times thanks to DPP+
Larger hood: From 90 up to 170 mm possible height of samples, depending on device
Apertures: fixed or 4-fold changeable* Primary filters: fixed or 6-fold changeable* *depending on device
Type approved full protection device
Smallest measuring spot approx.: Ø 0.3 mm
Determination of metal content in electroplating baths with corresponding accessories
Do you have further applications? Then contact us!
Features
- Microfocus tube with tungsten anode
- Silicon PIN and silicon drift detectors provide very good detection accuracy and high resolution
- Higher count rates and significantly reduced measurement times thanks to DPP+
- Larger hood: From 90 up to 170 mm possible height of samples, depending on device
- Apertures: fixed or 4-fold changeable* Primary filters: fixed or 6-fold changeable* *depending on device
- Type approved full protection device
- Smallest measuring spot approx.: Ø 0.3 mm
- Determination of metal content in electroplating baths with corresponding accessories
- Various measuring table options: Fixed or manual
- RoHS analysis: Reliable determination of hazardous substances
- Video microscope for convenient determination of the optimal measuring point
- Non-destructive analysis of dental alloys
- Multilayer coatings
- Analysis of functional layers from 10 nm in the electronics and semiconductor industry
- Trace analyses for consumer protection, such as lead content in toys
- Metal alloy determination with highest accuracy requirements in the jewelry industry and refineries
Documents
- AN004 Determination of harmful substances in very small concentrations – RoHS0.48 MB
- AN024 Analysis of tarnish-resistant silver alloys0.49 MB
- AN026 Determination of the silver content of silver plated or blanched silver alloys0.55 MB
- AN028 Using X-ray fluorescence for fast, reliable gold analysis in the gold-buying industry0.51 MB
- AN029 Precious metal analysis via X-ray fluorescence for assaying offices and precious metals refineries0.55 MB
- AN092 How to choose an XRF instrument1.29 MB
- Product overview: Complete portfolio3.17 MB
- Product overview: FISCHERSCOPE® X-RAY series3.67 MB
Videos
- FISCHERSCOPE® X-RAY XAN® 250: Introduction
- FISCHERSCOPE® X-RAY XAN® 252: Introduction
- FISCHERSCOPE® X-RAY: Calibration of X-ray measuring instruments
- FISCHERSCOPE® X-RAY tutorial: Stability test
- FISCHERSCOPE® X-RAY tutorial part 1: Export / Import products in WinFTM®
- FISCHERSCOPE® X-RAY tutorial part 2: Export / Import products in WinFTM®
