FISCHERSCOPE® XDAL®
The best detectors for thin layers.
Innovative benchtop successor for coating thickness measurement of very thin and complex coatings, as well as for material analysis in the ppm range.
Key Benefits
- High-speed Z-axis.: For fast positioning of your samples
- Autofocus under 2 seconds.: Fast acquisition and focusing of your measurement object for even more efficient measurement processes
- High-resolution overview camera.: Keep a better overview with sharper and more detailed images
- Multi-zone LED lighting.: Perfect illumination at all times, no matter the surface
Description
Innovative benchtop successor for coating thickness measurement of very thin and complex coatings, even < 0.05 μm, as well as for material analysis in the ppm range.
¹ In comparison to FISCHERSCOPE® X-RAY XDAL® 237. ² Depending on the sample surface.
The FISCHERSCOPE® XDAL® is ideal for applications in the field of thin and very thin coatings < 0.05 μm and for material analysis in the ppm range. The device version is equipped with the latest generation of powerful detectors, a 50 mm² silicon drift detector. The intuitive status lighting and the automated measuring hood, together with the modern FISIQ® X XRF software, ensure a smooth measuring process – for greater convenience, safety and maximum throughput.
For fast positioning of your samples
Fast acquisition and focusing of your measurement object for even more efficient measurement processes
Keep a better overview with sharper and more detailed images
Perfect illumination at all times, no matter the surface
Manual or automated operation for maximum flexibility
Unparalleled measurement accuracy thanks to enhanced spacing between X-ray tube, sample, and detector
Check the device's status at a glance
Microfocus tube with tungsten anode, other anodes available on request
C-slot housing for automated measurements on larger samples
Silicon drift detector 20 mm² or 50 mm² for highest precision on thin layers
4-fold changeable apertures and 6-fold changeable filters
Type approved full protection device
Software FISIQ® X with AI-supported spectrum mode for smarter measurement processes
Stepless measuring distance with measuring top down
Up to 140 mm possible heights of samples
Programmable measuring table for automated measurements
Do you have further applications? Then contact us!
Features
- Microfocus tube with tungsten anode, other anodes available on request
- C-slot housing for automated measurements on larger samples
- Silicon drift detector 20 mm² or 50 mm² for highest precision on thin layers
- 4-fold changeable apertures and 6-fold changeable filters
- Type approved full protection device
- Software FISIQ® X with AI-supported spectrum mode for smarter measurement processes
- Stepless measuring distance with measuring top down
- Up to 140 mm possible heights of samples
- Programmable measuring table for automated measurements
- 6x ¹ ² faster positioning
- 14x ¹ faster autofocus
- 10x ¹ higher camera resolution
- Analysis of very thin coatings of ≤ 0.1 μm (0.004 mils)
- Measurements of functional coatings in the electronics and semiconductor industries, e.g. on lead frames, connectors or printed circuit boards
- Determination of complex multi-coating systems
- Automated measurements, e.g., in quality control
- Determination of the lead content in solder
- Determination of the phosphorous content in NiP coatings
- Determination of PCB finishes
