FISCHERSCOPE® X-RAY XDV®-SDD
The high-end all-rounder.
Powerful measuring device for universal use – from the inspection of very thin or complex layers to RoHS screening at very low detection limits.
Key Benefits
- Built to last.: Robust design for particularly high requirements
- Fully automatable.: Let your device work for you with just one click
- Quick-measure design.: With a few simple steps, the sample is placed and ready for measurement. Automated measurements of many parts are possible
- Fast.: Thanks to short measuring times, you save valuable time
Description
Powerful measuring device for universal use for the inspection of very thin or complex layers up to RoHS screening at very low detection limits.
¹ Significantly improved standard deviation and thus gauge capability or significantly reduced measurement time compared DPP to DPP+.
The FISCHERSCOPE® X-RAY XDV®-SDD is one of the most powerful X-ray fluorescence instruments in the Fischer portfolio. Take your measurement performance to a new level with this premium model: In combination with the in-house developed digital pulse processor DPP+, even higher count rates can now be processed, resulting in reduced measuring times or improved repeatability of your measurement results.
Robust design for particularly high requirements
Let your device work for you with just one click
With a few simple steps, the sample is placed and ready for measurement. Automated measurements of many parts are possible
Thanks to short measuring times, you save valuable time
Determination of pollutants with high detection accuracy and outstanding performance
Shorter measuring times or improvement of standard deviation*
*compared to the DPP
Microfocus tube with tungsten anode
Silicon drift detector 50 mm² with extra-large effective area of 50 mm²
Determination of metal content in electroplating baths with corresponding accessories
Measuring spot approx.: Ø 0.25 mm
Higher count rates and significantly reduced measurement times thanks to DPP+
Type approved full protection device
Up to 140 mm possible height of samples
4-fold changeable apertures and 6-fold changeable filters
Do you have further applications? Then contact us!
Features
- Microfocus tube with tungsten anode
- Silicon drift detector 50 mm² with extra-large effective area of 50 mm²
- Determination of metal content in electroplating baths with corresponding accessories
- Measuring spot approx.: Ø 0.25 mm
- Higher count rates and significantly reduced measurement times thanks to DPP+
- Type approved full protection device
- Up to 140 mm possible height of samples
- 4-fold changeable apertures and 6-fold changeable filters
- Up to 50% ¹ increased performance thanks to DPP+
- 4-fold changeable apertures
- 6-fold changeable filters
- Measuring functional coatings in the electronics and semiconductor industry, e.g. determining the thickness of gold coatings down to 2 nm
- Analysis of thin and very thin coatings in the electronics and semiconductor industry, such as gold/palladium layers of ≤ 0.1 μm
- Determination of complex multilayer systems
- Coating thickness measurement for photovoltaics, fuel cell and battery cell applications
- Trace analyses of hazardous substances such as lead and cadmium according to RoHS, WEEE, CPSIA and other directives for electronics, packaging and consumer products
- Analysis and authenticity check of gold and other precious metals and precious metal alloys
- Direct determination of phosphorus content in functional NiP layers
- Determination of the metal content of electroplating baths
Documents
- AN001 Au/Pd Coatings in the nm Range on Printed Circuit Boards0.48 MB
- AN002 Phosphorous Content in Electroless Nickel Directly Measurable0.52 MB
- AN003 High repeatability precision and trueness of Au/Pd coating measurements on leadframes0.69 MB
- AN004 Determination of harmful substances in very small concentrations – RoHS0.48 MB
- AN006 Determination of platinum, rhodium and palladium in automotive catalytic converters0.58 MB
- AN021 Trace element analysis in materials for fashion jewellery and accessories0.51 MB
- AN073 Analysis of harmful substances in textiles for Oeko-Tex® certification0.75 MB
- AN092 How to choose an XRF instrument1.29 MB
- AN093 XRF analysis for non-destructive coating thickness measurement in the field of cold forging0.75 MB
- AN097 Prior to hallmarking, for high sample volumes or large test parts: Measure gold content quickly and reliably0.69 MB
- AN109 Measuring very thin components and foils with the sample stage Zero Background0.41 MB
- Product overview: Complete portfolio3.17 MB
- Product overview: FISCHERSCOPE® X-RAY series3.67 MB
- Solutions for gold, precious metals & jewelry3.64 MB
- Solutions for Semiconductors1.73 MB
Videos
- FISCHERSCOPE® X-RAY XDV®-SDD: Introduction
- FISCHERSCOPE® X-RAY XDV® series: Up to 50% improved performance
- FISCHERSCOPE® X-RAY: Calibration of X-ray measuring instruments
- FISCHERSCOPE® X-RAY tutorial: Stability test
- FISCHERSCOPE® X-RAY tutorial part 1: Export / Import products in WinFTM®
- FISCHERSCOPE® X-RAY tutorial part 2: Export / Import products in WinFTM®
