FISCHERSCOPE® X-RAY XDV®-µ LD
Smallest measuring spot, l
High-end XRF measuring device with polycapillary X-ray optics for measuring on smallest components with smallest measuring spot and largest measuring distance.
Key Benefits
- Meeting all challenges.: Reliable and fast results for ambitious measuring tasks
- Most advanced polycapillary optics on the market.: Our in-house manufactured polycapillary optics deliver outstanding measurement results with short measuring times
- Programmable.: Automated measurements on predefined structures thanks to advanced pattern recognition technology
- Fully automatable.: Let your instrument work for you with just one click
Description
Mastering demanding measuring tasks with polycapillaries: High-end XRF measuring device with polycapillary X-ray optics for measuring on the smallest components with smallest measuring spot and largest measuring distance.
¹ Significantly improved standard deviation and thus gauge capability or significantly reduced measurement time compared DPP to DPP+.
The high point for complex shaped small test parts. The FISCHERSCOPE® X-RAY XDV®-μ LD brings unparalleled measuring distance combined with the smallest measuring spot and microfocus tube Ultra for higher performance with smallest measuring sports, making it the industry-leading XRF instrument.
Reliable and fast results for ambitious measuring tasks
Our in-house manufactured polycapillary optics deliver outstanding measurement results with short measuring times
Automated measurements on predefined structures thanks to advanced pattern recognition technology
Let your instrument work for you with just one click
Shorter measuring times or improvement of standard deviation*
*compared to the DPP
Microfocus tube Ultra with tungsten anode for even higher performance on smallest spots; Molybdenum anode optional
Changeable filter
Higher count rates and significantly reduced measurement times thanks to DPP+
Polycapillary optics allow particularly small measuring spots with short measuring times with high intensity
Measuring spot approx.: Ø 60 µm
Determination of metal content in electroplating baths with corresponding accessories
Silicon drift detector with 20 or 50 mm² active area for highest precision with thin layers
Up to 135 mm possible height of samples
Do you have further applications? Then contact us!
Features
- Microfocus tube Ultra with tungsten anode for even higher performance on smallest spots; Molybdenum anode optional
- Changeable filter
- Higher count rates and significantly reduced measurement times thanks to DPP+
- Polycapillary optics allow particularly small measuring spots with short measuring times with high intensity
- Measuring spot approx.: Ø 60 µm
- Determination of metal content in electroplating baths with corresponding accessories
- Silicon drift detector with 20 or 50 mm² active area for highest precision with thin layers
- Up to 135 mm possible height of samples
- Up to 50% ¹ increased performance thanks to DPP+
- 60 µm smallest spot size
- 12 mm largest measurement distance - best in class!
- Measuring on smallest components and structures like assembled and complex shaped PCBs, plug contacts, bonding areas, SMD components or thin wires
- Measuring of functional layers in the electronics and semiconductor industry
- Determination of complex multilayer systems
- Automated measuring, such as in quality control
Documents
Videos
- FISCHERSCOPE® X-RAY XDV® series: Up to 50% improved performance
- FISCHERSCOPE® X-RAY: Calibration of X-ray measuring instruments
- FISCHERSCOPE® X-RAY tutorial: Stability test
- FISCHERSCOPE® X-RAY tutorial part 1: Export / Import products in WinFTM®
- FISCHERSCOPE® X-RAY tutorial part 2: Export / Import products in WinFTM®
