FISCHERSCOPE® X-RAY XDV®-µ
Smallest measuring surface, highest
Universal instrument for measuring on smallest and flat components and structures as well as complex multilayer systems.
Key Benefits
- Meeting all challenges.: Reliable and fast results for ambitious measuring tasks
- Most advanced polycapillary optics on the market.: Our in-house manufactured polycapillary optics deliver outstanding measurement results with short measuring times
- Programmable.: Automated measurements on predefined structures thanks to advanced pattern recognition technology
- Fully automatable.: Let your instrument work for you with just one click
Description
Universal instrument for measuring on very small and flat components and structures as well as complex multilayer systems.
¹ Significantly improved standard deviation and thus gauge capability or significantly reduced measurement time compared DPP to DPP+. ² Polycapillary optics, which are constantly being further developed. High-end capillary optics made by Fischer – the world's only manufacturer of X-ray fluorescence measuring instruments with its own polycapillary production. ³ Three different high-end polycapillaries available – the right solution for each of your applications: 10 µm halo-free, 20 µm halo-free or 20 µm halo.
The FISCHERSCOPE® X-RAY XDV®-µ instruments are among Fischer's high-end X-ray fluorescence measuring devices and are ideal for measuring tiny structures. They are equipped with the latest generation of powerful silicon drift detectors, microfocus tube Ultra and in-house produced polycapillary optics. Due to the high radiation intensity, measuring times are drastically reduced and highly precise measurements on the smallest measuring spots are possible.
Reliable and fast results for ambitious measuring tasks
Our in-house manufactured polycapillary optics deliver outstanding measurement results with short measuring times
Automated measurements on predefined structures thanks to advanced pattern recognition technology
Let your instrument work for you with just one click
Shorter measuring times or improvement of standard deviation*
*compared to the DPP
Microfocus tube Ultra with tungsten anode for even higher performance on smallest spots; Molybdenum anode optional
Changeable filter
Higher count rates and significantly reduced measurement times thanks to DPP+
Polycapillary optics allow particularly small measuring spots with short measuring times with high intensity
Measuring spot approx.: Ø 10 or 20 µm
Silicon drift detector with 20 or 50 mm² active area for highest precision
Up to 135 mm possible height of samples
Do you have further applications? Then contact us!
Features
- Microfocus tube Ultra with tungsten anode for even higher performance on smallest spots; Molybdenum anode optional
- Changeable filter
- Higher count rates and significantly reduced measurement times thanks to DPP+
- Polycapillary optics allow particularly small measuring spots with short measuring times with high intensity
- Measuring spot approx.: Ø 10 or 20 µm
- Silicon drift detector with 20 or 50 mm² active area for highest precision
- Up to 135 mm possible height of samples
- Up to 50% ¹ increased performance thanks to DPP+
- Polycapillary optics Produced in-house & constantly developed²
- 3 options for the suitable polycapillary optic³
- Measuring on smallest, flat components and structures like traces, contacts or lead frames
- Measuring functional layers in the electronics and semiconductor industry
- Determination of complex multilayer systems
- Automated measuring, such as in quality control
- Measuring of light elements, e.g. determination of phosphorus content in electroless nickel under gold and palladium (ENIG/ENEPIG)
Documents
- AN003 High repeatability precision and trueness of Au/Pd coating measurements on leadframes0.69 MB
- AN008 Thickness and composition of NiP on connectors or small structures on PCBs0.56 MB
- AN032 Material analysis of solder bumps in the Integrated circuit (IC) packaging industry0.57 MB
- AN092 How to choose an XRF instrument1.29 MB
- AN093 XRF analysis for non-destructive coating thickness measurement in the field of cold forging0.75 MB
- AN098 Optimized for the electronics industry: Measuring ENIG and ENEPIG on a new level1.46 MB
- AN109 Measuring very thin components and foils with the sample stage Zero Background0.41 MB
- Product overview: Complete portfolio3.17 MB
- Product overview: FISCHERSCOPE® X-RAY series3.67 MB
- Solutions for Semiconductors1.73 MB
Videos
- FISCHERSCOPE® X-RAY XDV® series: Up to 50% improved performance
- FISCHERSCOPE® X-RAY: Calibration of X-ray measuring instruments
- FISCHERSCOPE® X-RAY tutorial: Stability test
- FISCHERSCOPE® X-RAY tutorial part 1: Export / Import products in WinFTM®
- FISCHERSCOPE® X-RAY tutorial part 2: Export / Import products in WinFTM®
- FISCHERSCOPE® X-RAY XDV®-µ: Automated measurements on smallest structures using pattern recognition
- FISCHERSCOPE® X-RAY XDV®-µ tutorial part 1: Introduction
- FISCHERSCOPE® X-RAY XDV®-µ tutorial part 2: Test of stability, calibration and normalization
- FISCHERSCOPE® X-RAY XDV®-µ tutorial part 3: XY programming
