FISCHERSCOPE® X-RAY XDLM®
Your entry into automated measuring.
Universal instrument for inspection of small parts and small structures, measuring of light metals, hard coatings and thin electroplated parts.
Key Benefits
- Commissioning.: Extremely fast and simple
- Tailor-made.: Different models offer the optimal solution for your application
- Testing of multiple measuring points.: Even with large samples, measuring points are possible on the entire sample surface
- Also for large samples.: Hood with C-slot
Description
Universal instrument for inspection of small parts and small structures, measuring of light metals, hard coatings and thin electroplated parts.
Equipped with a microfocus tube, multiple aperture and primary filter changer, the XDLM® series is the best choice to inspect many small parts one after the other. The instruments are closely related to the XULM® series, with only one significant difference: measuring direction from top down! This means: convenient analysis of uneven samples as well as the possibility of automated measuring and therefore predestined for quality assurance, incoming goods inspection and production monitoring. As a special solution for PCBs, the device is available as XDLM® PCB.
Extremely fast and simple
Different models offer the optimal solution for your application
Even with large samples, measuring points are possible on the entire sample surface
Hood with C-slot
Robust design for measurement on mass parts
The sample is placed and ready for measurement in just a few steps
Microfocus tube
Proportional counter tube detector for short measuring times and small measuring spots
Up to 140 mm possible height of samples
4-fold changeable apertures
Smallest measuring spot approx.: Ø 0.1 mm
Determination of metal content in electroplating baths with corresponding accessories
3-fold changeable filters
Various measuring table options
Type approved full protection device
Do you have further applications? Then contact us!
Features
- Microfocus tube
- Proportional counter tube detector for short measuring times and small measuring spots
- Up to 140 mm possible height of samples
- 4-fold changeable apertures
- Smallest measuring spot approx.: Ø 0.1 mm
- Determination of metal content in electroplating baths with corresponding accessories
- 3-fold changeable filters
- Various measuring table options
- Type approved full protection device
- Adjustment of the measuring distance through patented DCM method
- Type approved full protection device
- PC-detector with largest measuring window on the market
- Electroplated coatings such as zinc on iron as corrosion protection
- Serial testing of mass-produced parts
- Compositional analysis of special steels, such as molybdenum detection in A4
- Decorative chromium coatings, e.g. Cr/Ni/Cu/ABS
- All typical chromium coatings - also new ones such as CrVI
- Measuring of functional gold coatings on PCBs such as Au/Ni/Cu/PCB or Sn/Cu/PCB
- Coatings of connectors and contacts in the electronics industry such as Au/Ni/Cu and Sn/Ni/Cu
- Determination of the metal content of electroplating baths
Documents
- AN059 Determining coating thickness on PVD-coated tools0.47 MB
- AN072 Simplifying quality control on PCBs with automatic pattern recognition0.67 MB
- AN076 Material analysis of corrosion resistant fasteners0.95 MB
- AN092 How to choose an XRF instrument1.29 MB
- AN094 XRF analysis with proportional counter tube – These are the advantages0.36 MB
- Product overview: Complete portfolio3.17 MB
- Product overview: FISCHERSCOPE® X-RAY series3.67 MB
Videos
- FISCHERSCOPE® X-RAY XDLM® 237: Introduction
- FISCHERSCOPE® X-RAY: Calibration of X-ray measuring instruments
- FISCHERSCOPE® X-RAY tutorial: Stability test
- FISCHERSCOPE® X-RAY tutorial part 1: Export / Import products in WinFTM®
- FISCHERSCOPE® X-RAY tutorial part 2: Export / Import products in WinFTM®
- FISCHERSCOPE® X-RAY XDLM® 237: Solution analysis of electrolytes – easy & fast
- FISCHERSCOPE® X-RAY XDLM® 237: Programmable, motor-driven XY-stage for automated measurements
- FISCHERSCOPE® X-RAY XDLM® tutorial part 1: Introduction, warm up and reference measurement
- FISCHERSCOPE® X-RAY XDLM® tutorial part 2: Standard free measurements, calibration and normalization
- FISCHERSCOPE® X-RAY XDLM® tutorial part 3: XY programming and pattern recognition
