FISCHERSCOPE® X-RAY XDAL®
The best detectors for thin layers.
Universal instrument for automated measuring of thin and very thin layers < 0.05 μm and for material analysis in the ppm range.
Key Benefits
- Commissioning.: Extremely fast and simple
- One device, many possibilities.: Coating thickness measurement, material analysis and trace analysis
- Testing of multiple measuring points.: Even with large samples, measuring points are possible on the entire sample surface
- Also for large samples.: Hood with C-slot
Description
Universal XRF instrument for automated measuring of thin and very thin layers < 0.05 μm and for material analysis in the ppm range.
Thin, thinner, XDAL®: Thanks to its microfocus tube and various semiconductor detectors, the FISCHERSCOPE® X-RAY XDAL® series is ideal for applications in the field of thin and very thin coatings < 0.05 μm as well as for material analysis in the ppm range. The instrument version with the 50 mm² silicon drift detector is furthermore suitable for RoHS measuring. The flexible and thanks to various configuration options (table, aperture, filter and detector), universal XDAL® measures reliably, precisely and stands for 100 % safety.
Extremely fast and simple
Coating thickness measurement, material analysis and trace analysis
Even with large samples, measuring points are possible on the entire sample surface
Hood with C-slot
Let your instrument work for you with just one click
Very good compromise between performance and space requirements
Microfocus tube with tungsten anode
Measuring spot approx.: Ø 0.15 mm
Silicon PIN and silicon drift detector for very good detection accuracy and high resolution
3-fold changeable filters
Type approved full protection device
Determination of metal content in electroplating baths with corresponding accessories
4-fold changeable apertures
Up to 140 mm possible heights of samples
Various measuring table options
Do you have further applications? Then contact us!
Features
- Microfocus tube with tungsten anode
- Measuring spot approx.: Ø 0.15 mm
- Silicon PIN and silicon drift detector for very good detection accuracy and high resolution
- 3-fold changeable filters
- Type approved full protection device
- Determination of metal content in electroplating baths with corresponding accessories
- 4-fold changeable apertures
- Up to 140 mm possible heights of samples
- Various measuring table options
- Adjustment of the measuring distance through patented DCM method
- Type approved full protection device
- Completely automatable
- Analysis of thin and very thin coatings of ≤ 0.05 μm
- Measuring functional coatings in the electronics and semiconductor industry, such as on lead frames, plug contacts or PCBs
- Determination of complex multilayer systems
- Automated measurements, such as in quality control
- Determination of lead content in solders
- With version SDD (20 mm² or 50 mm²): Determination of phosphorus content in NiP layersMeets ENIG/ENEPIG requirements
- Determination of phosphorus content in NiP layers
- Meets ENIG/ENEPIG requirements
Documents
- AN001 Au/Pd coatings in the nm range on printed circuit boards0.48 MB
- AN068 Determination of Pb in solder alloys for high reliability applications0.67 MB
- AN081 Analysing cemented carbide alloys used for making cutting tools0.50 MB
- AN092 How to choose an XRF instrument1.29 MB
- AN093 XRF analysis for non-destructive coating thickness measurement in the field of cold forging0.75 MB
- AN109 Measuring very thin components and foils with the sample stage Zero Background0.41 MB
- Product overview: Complete portfolio3.17 MB
- Product overview: FISCHERSCOPE® X-RAY series3.67 MB
- Technical article ISITES 2021: Characterization of Zinc Coating by Sherardizing Process1.20 MB
