BETASCOPE®
The extra power for your special application.
The module for determining the thickness of organic and metallic layers on a wide variety of substrates using the beta-backscattering method.
Key Benefits
- Easy to use.: Simple device operation and graphically supported user guidance
- Unique in the market.: Fischer is one of a few measuring instrument manufacturers with beta sources
- Perfect fit.: Device fits specifically to your measurement and testing requirements
- Automatable.: Measure manually or semi-automatically
Description
The module for determining the thickness of organic and metallic layers on a wide variety of substrates using the beta-backscattering method.
The BETASCOPE® is a module for upgrading a FISCHERSCOPE® MMS® PC2 basic instrument. It is designed to determine the thickness of organic and metallic coatings on a wide variety of substrates, provided there is a sufficiently large difference between the atomic order numbers of the coating and base material.
Simple device operation and graphically supported user guidance
Fischer is one of a few measuring instrument manufacturers with beta sources
Device fits specifically to your measurement and testing requirements
Measure manually or semi-automatically
Thick gold coatings, thin insulating varnishes on electrical steel sheets or oil films on metals
Measuring the layer thickness of many layer-base material combinations
Measuring range: Dependent on coating-base material combination and beta emitter used
BETASCOPE® module for upgrading the basic device FISCHERSCOPE® MMS® PC2
Probes, apertures and emitters available for a wide range of applications
Measured value memory: For a large number of measurements
USB and RS232 interfaces
Measuring method: Beta-backscattering method, radiometric
Do you have other applications? Then contact us!
Features
- Measuring the layer thickness of many layer-base material combinations
- Measuring range: Dependent on coating-base material combination and beta emitter used
- BETASCOPE® module for upgrading the basic device FISCHERSCOPE® MMS® PC2
- Probes, apertures and emitters available for a wide range of applications
- Measured value memory: For a large number of measurements
- USB and RS232 interfaces
- Measuring method: Beta-backscattering method, radiometric
- Coating thickness analysis according to the beta-backscattering method
- Specialist for many layer-base material combinations
- Integrated temperature sensor
- Determining the thickness of organic and metallic layers on various substrates
- Measuring thin organic layers, for example Nano paint coatings on stainless steel (anti-fingerprint)Thickness of gold coatings up to 35 μm in the aerospace industryThin insulating coatings on electrical steel sheetsSoft coatings and liquid oil or lubricating films on metals
- Nano paint coatings on stainless steel (anti-fingerprint)
- Thickness of gold coatings up to 35 μm in the aerospace industry
- Thin insulating coatings on electrical steel sheets
- Soft coatings and liquid oil or lubricating films on metals
Documents
- AN069 Measuring the thickness of lubricants used in chipless metal processing0.69 MB
- AN091 Different ways to achieve valid measurement values and optimize measurement performance0.20 MB
- AN108 Measuring technology for e-mobility: Coating thickness measurement on painted electrical steel sheets3.90 MB
- Product overview: Complete portfolio3.17 MB
- Product overview: Tactile measuring devices4.82 MB
