FISCHERSCOPE® X-RAY 5000 series
Inline measuring with highest precision for thin films.
Robust XRF instruments for measuring and analyzing thin films and film systems in the running process with connection to the production control system.
Key Benefits
- Tailor-made.: Easy integration, individually adaptable to your application
- Does not break a sweat.: Sample temperatures up to 250 °C (482 °F) thanks to water cooling
- DPP+ digital pulse processor.: Shorter measuring times or improvement of standard deviation*
- Robust and reliable.: No moving parts
Description
Robust XRF instrument for measuring and analyzing thin films and layer systems in the running process with connection to the production control system.
¹ Significantly improved standard deviation and thus gauge capability or significantly reduced measurement time compared DPP to DPP+. ² Only FISCHERSCOPE® X-RAY 5400.
Designed for maximum uptime, the FISCHERSCOPE® X-RAY 5000 series convinces among other things with a high degree of customization and outstanding measurement performance - non-contact, non-destructive and precise. The devices of this series form modular units, which is why they can be easily installed as pure components in an existing plant.
Easy integration, individually adaptable to your application
Sample temperatures up to 250 °C (482 °F) thanks to water cooling
Shorter measuring times or improvement of standard deviation*
*compared to the DPP
No moving parts
Measuring head with all necessary components in one unit
Can be mounted on vacuum chambers
Microfocus tube with tungsten anode; molybdenum anode optional
Fixed aperture (configurable up to Ø 11 mm)
For measuring in vacuum or in the air
Optionally with water cooling for sample temperatures up to 250 °C
Silicon drift detector 50 mm² for highest precision
Fixed filter (configurable)
Peltier cooling
Higher count rates and significantly reduced measurement times thanks to DPP+
Any installation position possible
Remote control and data export via TCP/IP interface
You have further applications? Then contact us!
Features
- Microfocus tube with tungsten anode; molybdenum anode optional
- Fixed aperture (configurable up to Ø 11 mm)
- For measuring in vacuum or in the air
- Optionally with water cooling for sample temperatures up to 250 °C
- Silicon drift detector 50 mm² for highest precision
- Fixed filter (configurable)
- Peltier cooling
- Higher count rates and significantly reduced measurement times thanks to DPP+
- Any installation position possible
- Remote control and data export via TCP/IP interface
- Up to 50% ¹ increased performance thanks to DPP+
- Robust and low maintenance through immovable parts
- Measuring in vacuum ² or in the air
- Measuring thin coatings and low loadings on large-area products and substrates, such as fuel cells, on glass panels and very hot surfaces
- Monitoring the composition and thickness of layers in photovoltaics such as CIGS, CIS, CdTe and CdS
- Measuring thin layers of a few µm on metal strips, metal foils and plastic films
- Process monitoring of sputtering and electroplating equipment
Documents
- AN055 Ensuring high efficiency of thin film photovoltaic modules with inline measurement0.25 MB
- AN095 Inline measurement of platinum and other catalytic metals on fuel cell membranes1.50 MB
- Product overview: Automated measurement solutions4.91 MB
- Product overview: Complete portfolio3.17 MB
- Product overview: FISCHERSCOPE® X-RAY series3.67 MB
