





TERASCOPE®
Unbeatable in automated terahertz measurement.
Automated measurement solution for coating thickness measurement of organic and dielectric single and multilayers as well as material analysis with terahertz waves.
Key Benefits
- Market-leading measurement performance.: Up to 6 THz bandwidth* for highest precision and repeatability
- Faster than any vibration.: Precise measurement results even in harsh environments thanks to uniquely high sampling rate of 1.6 kHz*
- High reliability.: Robust, low-maintenance, developed for 24/7 operation
- Low maintenance.: Less wear and tear due to electro-optical measurement
Description
Automated measurement solution for coating thickness measurement of organic and dielectric single and multilayers as well as material analysis with terahertz waves.
Availability depending on region and country.
¹ Depending on configuration.
With market-leading precision, repeatability and speed, the innovative TERASCOPE® measurement system is perfectly suited for fully automated inline measuring. Absolutely non-destructive and contactless, the TERASCOPE® penetrates all organic and dielectric materials and can therefore be used for a wide variety of measuring tasks. Its modular design allows system manufacturers and integrators to integrate the measurement system flexibly and individually into the production process.
Up to 6 THz bandwidth* for highest precision and repeatability
Precise measurement results even in harsh environments thanks to uniquely high sampling rate of 1.6 kHz*
Robust, low-maintenance, developed for 24/7 operation
Less wear and tear due to electro-optical measurement
* Depending on configuration.
Continuous dry air purging for unadulterated measurement results
High-precision positioning even on round surfaces and complex geometries
Hardware and software designed for robot and control systems
Bandwidth: Up to 6 THz, depending on configuration
Spot size: ⌀ 1 mm
Thickness of the layer(s): 10 μm to several millimeters
Integration, remote control and data export via fieldbus system
Sampling rate: 1.6 kHz, depending on configuration
Measuring distance: 7 cm
Measuring precision: Up to 1 μm, from 100 μm layer thickness up to 1 %, depending on the application
Measuring time: approx. 1 s
Number of layers: Up to 7, depending on material
Repeatability: < 0.1 μm
Coating thickness measurement of single and multilayer systems including detection of invisible defects and hidden corrosion
Determining of radar transmission and reflection
Coating thickness measurement of single or multilayer systems including detection of invisible defects and inclusions
Testing of material properties
For applications such as wafers and in the fields of biosensor technology, photovoltaics and many more.
Coating thickness measurement of single or multilayer systems including detection of invisible defects and hidden corrosion
Coating thickness measurement of single or multilayer systems including detection of invisible defects
Coating thickness measurement of single or multilayer systems including detection of invisible defects and inclusions
Coating thickness measurement of single or multilayer systems
Testing of material properties
For applications such as wafers and 2D materials (e. g. graphene in photovoltaics), paints, lacquers, and special inks for printing money and many more.
Features
- Up to 6 THz bandwidth ¹
- Clean-Trace technology for market-leading measurement performance
- Uniquely high sampling rate of 1.6 kHz ¹
- Battery foils
- Packagings
- Polymer functional layers such as EVOH
- Coextruded floor boards and films
- Bipolar plates for fuel cells
- All coated functionally- and safety-critical components made of plastic, polymers, or composite materials
- And much more



