TERASCOPE®

Automated measurement solution for coating thickness measurement of organic and dielectric single and multilayers as well as material analysis with terahertz waves.

Availability depending on region and country.

¹ Depending on configuration.

With market-leading precision, repeatability and speed, the innovative TERASCOPE® measurement system is perfectly suited for fully automated inline measuring. Absolutely non-destructive and contactless, the TERASCOPE® penetrates all organic and dielectric materials and can therefore be used for a wide variety of measuring tasks. Its modular design allows system manufacturers and integrators to integrate the measurement system flexibly and individually into the production process.

Up to 6 THz bandwidth* for highest precision and repeatability

Precise measurement results even in harsh environments thanks to uniquely high sampling rate of 1.6 kHz*

Robust, low-maintenance, developed for 24/7 operation

Less wear and tear due to electro-optical measurement

* Depending on configuration.

Continuous dry air purging for unadulterated measurement results

High-precision positioning even on round surfaces and complex geometries

Hardware and software designed for robot and control systems

Bandwidth: Up to 6 THz, depending on configuration

Spot size: ⌀ 1 mm

Thickness of the layer(s): 10 μm to several millimeters

Integration, remote control and data export via fieldbus system

Sampling rate: 1.6 kHz, depending on configuration

Measuring distance: 7 cm

Measuring precision: Up to 1 μm, from 100 μm layer thickness up to 1 %, depending on the application

Measuring time: approx. 1 s

Number of layers: Up to 7, depending on material

Repeatability: < 0.1 μm

Coating thickness measurement of single and multilayer systems including detection of invisible defects and hidden corrosion

Determining of radar transmission and reflection

Coating thickness measurement of single or multilayer systems including detection of invisible defects and inclusions

Testing of material properties

For applications such as wafers and in the fields of biosensor technology, photovoltaics and many more.

Coating thickness measurement of single or multilayer systems including detection of invisible defects and hidden corrosion

Coating thickness measurement of single or multilayer systems including detection of invisible defects

Coating thickness measurement of single or multilayer systems including detection of invisible defects and inclusions

Coating thickness measurement of single or multilayer systems

Testing of material properties

For applications such as wafers and 2D materials (e. g. graphene in photovoltaics), paints, lacquers, and special inks for printing money and many more.